Combined SEM-FIB-SPM-TOF-EDX-EBSD as a Multifunctional Tool
نویسندگان
چکیده
منابع مشابه
Optimization of 3D EBSD in a FIB-SEM System Using a Static Sample Setup
1. Laboratoire d’Etude des Microstructures et de Mécanique des Matériaux, LEM3, CNRS ISGMP, Université de Lorraine, F-57045 Metz Cedex 01, France 2. Laboratory of Excellence on Design of Alloy Metals for low-mAss Structures ('LabEx DAMAS'), Université de Lorraine, France 3. Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany 4. Carl Zeiss Microscopy GmbH, Carl-Zeiss Str. 56, 73447 Oberkochen,...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2012
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927612005041